Jungho
Park, Moussa Hamadache, Jong M Ha, Yunhan Kim, Kyumin Na, and Byeng D.
Youn, ¡°A Positive Energy Residual (PER) based Planetary Gear Fault
Detection Method under Variable Speed Conditions,¡± Mechanical Systems and Signal Processing, Vol. 117, pp.
347-360, 2019-02. DOI: https://doi.org/10.1016/j.ymssp.2018.08.010
Junmin
Lee, Hyunseok Oh, Chan Hee Park, Byeng D. Youn, and Bongtae Han, ¡°Test
Scheme and Degradation Model of Accumulated Electrostatic Discharge (ESD)
Damage for Insulated Gate Bipolar Transistor (IGBT) Prognostics,¡± IEEE
Transactions on Device and Materials Reliability, Vol. 19, No. 1, pp.
233-241, 2019-03. DOI: http://doi.org/10.1109/TDMR.2019.2898920
Woosung
Choi, Byeng D. Youn, Hyunseok Oh, and Nam H. Kim, ¡°A Bayesian Approach for
a Damage Growth Model Using Sporadically Measured and Heterogeneous on-site
Data from a Steam Turbine,¡± Reliability
Engineering & System Safety, Vol. 184, pp. 137-150, 2019-04. DOI: https://doi.org/10.1016/j.ress.2018.03.012
Joung
Taek Yoon, Byeng D. Youn, Minji Yoo, Yunhan Kim, and Sooho Kim, ¡°Life-Cycle
Maintenance Cost Analysis Framework Considering Time-Dependent False and
Missed Alarms for Fault Diagnosis,¡± Reliability
Engineering & System Safety, Vol. 184, pp. 181-192, 2019-04. DOI: https://doi.org/10.1016/j.ress.2018.06.006
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Myeongbaek
Youn, Jungho Park, and Byeng D. Youn, KSME-Best Paper Award, 2019-02-27.
(À±¸í¹é, ¹ÚÁ¤È£, À±º´µ¿, ´ëÇѱâ°èÇÐȸ 2018³âµµ Çмú´ëȸ ½Å·Ú¼ººÎ¹® ¿ì¼öÇлý³í¹®»ó, 2019-02-27)
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Mr.
Sooho Kim has been dispatched to Viper (Visual Information Processing for
Enhanced Retreival) Group, co-organized by Université de Genève (UniGe) and
Haute école de gestion de Genève (HES-SO) for visiting research. (À±º´µ¿ ±³¼ö´Ô ¿¬±¸½Ç ±è¼öÈ£ ¹Ú»ç°úÁ¤, Á¦³×¹Ù ´ëÇÐ Viper GroupÀ¸·Î ¿¬¼ö ÆÄ°ß)
Ms.
Chan Hee Park has been dispatched to smart convergence group, KIST (Korea
Institute of Science and Technology) Europe for visiting research. (À±º´µ¿ ±³¼ö´Ô ¿¬±¸½Ç ¹ÚÂùÈñ ¹Ú»ç°úÁ¤, Çѱ¹°úÇбâ¼ú¿¬±¸¼Ò(KIST) À¯·´ÁöºÎ ½º¸¶Æ® À¶ÇÕ ±×·ì¿¡
°øµ¿¿¬±¸ ¸ñÀûÀ¸·Î ÀÎÅÏ ÆÄ°ß)
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